運(yùn)算放大器表征的簡(jiǎn)化測(cè)試規(guī)定

The test set described in this paper allows complete quantitative
characterization of all dc operational amplifier parameters
quickly and with a minimum of additional equipment.
The method used is accurate and is equally suitable for laboratory
or production test—for quantitative readout or for limit
testing. As embodied here, the test set is conditioned for
testing the LM709 and LM101 amplifiers; however, simple
changes discussed in the text will allow testing of any of the
generally available operational amplifiers.
Amplifier parameters are tested over the full range of common
mode and power supply voltages with either of two output
loads. Test set sensitivity and stability are adequate for
testing all presently available integrated amplifiers.
The paper will be divided into two sections, i.e., a functional
description, and a discussion of circuit operation. Complete
construction information will be given including a layout for
the tester circuit boards.
FUNCTIONAL DESCRIPTION
The test set operates in one of three basic modes. These
are: (1) Bias Current Test; (2) Offset Voltage, Offset Current
Test; and (3) Transfer Function Test. In the first two of these
tests, the amplifier under test is exercised throughout its full
common mode range. In all three tests, power supply voltages
for the circuit under test may be set at ±5V, ±10V,
±15V, or ±20V.